Microanalytical Laboratory

The electron beam can be scanned across relatively large regions to collect scanning electron microscopy images (e.g. backscattered electron images), quantitative compositional maps (from X-ray wavelength dispersive spectroscopy) and cathodoluminescence images (visible light emitted during electron-beam irradiation). Collectively, the images can be used to reveal the spatial distribution of elements in a specimen. The images are commonly used to guide subsequent quantitative analyses. The real power of the EMP is that it has unmatched spatial resolution and quantitative capabilities. The electron beam can be focused onto sub-micron sized spots to conduct in-situ quantitative analyses of most elements in the periodic table down to concentrations as low as ~10 parts per million.

Cameca SXFive Electron Probe MicroAnalyzer

• A fully automated electron microprobe with a LaB6 electron gun and five wavelength dispersive spectrometers that contain large area diffraction crystals and complementary counters.  The instrument was specifically designed with a LaB6 electron gun and large area diffraction crystals facilitate chemical analysis down to trace element concentrations.
• The LaB6 electron gun can produce high beam currents (up to microampere levels) required to produce X-ray count rates from trace element concentrations of elements in materials.  Additionally, the LaB6 source can deliver a smaller beam diameter than a tungsten source, which improves spatial resolution for all types of analyses.  Scanning electron imaging is performed using backscattered and secondary electron detectors.  A cathodoluminescence detector can be used to observe compositional zoning that cannot be observed with backscattered electron imaging in some materials, and is especially useful for studying light emitting diodes (LED).  The integrated energy dispersive spectrometer is be used to quantify many major elements that can be spectrally resolved. The has five WDS spectrometers with a selection of diffracting crystals and detectors capable of measuring all elements with Z>4.  One spectrometer will contain four standard-sized diffracting crystals (TAP, PET, pseudocrystal for carbon to fluorine, and a pseudocrystal for boron to oxygen).  The remaining four spectrometers are outfitted with large-sized diffracting crystals to facilitate trace element measurements.  Because of their size, only two crystals can fit in each spectrometer.  The spectrometers have four large-sized PETs, a large-sized TAP, two large-sized LIFs and a large-sized pseudocrystal for (5B to 8O).  To perform accurate measurements of carbon and nitrogen, a decontamination system uses an oxygen beam to clean sample surfaces prior to and during analyses.  The lab is equipped with a system to coat electrically insulating materials with carbon and metals.

Renishaw inVia confocal Raman microscope

• 532 nm green laser
• Transmitted and reflected light
• Confocal capability
• Motorized stage positioning & focusing
• Objectives: 5x, 20x, 50x, 100x
• Renishaw WiRE software

JEOL JCM-6000Plus Benchtop SEM

• Secondary electron and Backscattered electron imaging
• Tilt rotation motorized holder
• Accelerating voltages: 5, 10, or 15 kV
• Full-auto, filament adjustment, alignment, focus, stigmator, exposure
• EDS Detector
• Dx200s Digital Pulse Processor
• DII-29010SCTR Smart Coater (Gold)

Bruker Vertex 70v Fourier transform infrared (FTIR) spectrometer

• Hyperion infrared microscope system
• Infrared ‘light’ sources and detectors capable of measuring vibrational frequencies in the mid- to near-infrared spectral regions of materials (solid, liquid, or gas)
• IR beam can be transmitted or reflected on spots down to ~15 µm
• Magnification lenses: 4x, 10x, 36x
• OPUS software

Other facilities

• Sample preparation facility with optical microscopes, fluid inclusion heating/cooling stage, and polishing equipment
• Rock cutting and preparation facility with various saws and cutting appliances
• Experimental mineralogy laboratory with piston cylinder apparatuses and multi-atmosphere pressure furnaces

The Syracuse University Microanalytical Laboratory encourages collaborations among students and scientists from many disciplines at institutions and industries in the central New York region, nationally, and internationally.

Potential users with questions about the Electron Microprobe, the Scanning Electron Microscope, FTIR, and/or the Raman Microscope should email Jay Thomas and cc lab manager Zach Osborne.

Instrument reservations and billing are now managed by an online system, Priority Software® Facility Billing System (FBS).

• To be added to the FBS system, or for any questions about scheduling and/or billing, please email lab manager Zach Osborne.

You can login to FBS with your email and password here: https://syr.fbs.io/Apps/FBS

• Instructions for everyone on how to schedule instrument time, along with instructions for PIs to manage users and PayAliases, can be found in this pdf: FBS_Instructions
• Users who have been trained on an instrument will be able to request instrument time as unassisted (without technician help) or assisted (with technician help, which is the unassisted rate with the technician hourly rate added on)
• Users who have not been trained will need to request training for an instrument before being allowed to request unassisted instrument time.
• Within FBS, you will see that there are options for hourly or daily reservations; making a daily reservation will require you to select the entire 9 am through 5 pm time blocks on the scheduling calendar.

The most up-to-date instrument availability will be found within the FBS system.

• The Google calendars below are updated frequently but might not reflect all instrument reservations.